EDN

Electroglas rolls out test handler for wafer-level packages, known-good die

MUNICH — Electroglas Inc. today at the Semicon Europa trade show here introduced a new test-handling solution for devices in wafer-level packages, unpackaged known-good die products, thin wafers, ...
EDN

TEL debuts handler for wafer-level packages, KGD

TOKYO–Japan's Tokyo Electron Ltd. (TEL) announced Monday (April 12) that it will begin sales of a test handler that supports wafer-level packages and known-good die (KGD) products. Current process ...
Semiconductor Engineering

Singulated Die Test Ensures Stacked Die Quality As Power Density Rises

The high power density in turn produces large thermal gradients, with the low to max temperature changes increasing ...
Nasdaq

Aehr Receives Order from New Customer for FOX-NP(TM) Multi-Wafer Test and Burn-in System for Silicon Carbide Power MOSFETs

FREMONT, CA / ACCESSWIRE / April 2, 2024 / Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced it has received an initial customer order ...
Business Wire

Electroglas' Sidewinder Strip Test Handler Named Best New Product for Handling Equipment by Advanced Packaging; Annual Award Honors Advancement in Semiconductor Packaging ...

SAN JOSE, Calif.--(BUSINESS WIRE)--July 15, 2004--Electroglas, Inc. (Nasdaq:EGLS), a leading supplier of wafer probing and test handling solutions for the semiconductor industry, today announced that ...
Nasdaq

Aehr to Showcase FOX-P™ Wafer-Level, Die and Module Test Solutions at Virtual SWTest Untethered 2020 Conference on November 11

FREMONT, Calif., Nov. 09, 2020 (GLOBE NEWSWIRE) -- Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor test and reliability qualification equipment, will be showcasing its FOX-P™ ...
Yahoo Finance

RoodMicrotec and AEM announce strategic cooperation in the Central European market

This equipment is also set up for 200 mm wafer frame probing of a wide range of semiconductor devices. As a pioneer in developing and deploying application-specific test solutions for MEMS devices, ...
Electronics360

Three big semiconductor test probe challenges

Semiconductor testing has traditionally functioned as a stable screening step in the manufacturing flow so that failing devices can be identified and separated prior to packaging. Test infrastructure ...
Seeking Alpha

Aehr Announces New Advanced Testing Capabilities on its FOX-P™ Wafer Level Test & Burn-in Systems for Silicon Carbide and Gallium Nitride Technologies

FREMONT, Calif., Oct. 06, 2022 (GLOBE NEWSWIRE) -- Aehr Test Systems (AEHR), a worldwide supplier of semiconductor test and reliability qualification equipment, today announced it has released two new ...
Seeking Alpha

Aehr Announces Initial FOX-XP Multi-wafer Test and Burn-in Production System Order from Major Gallium Nitride Power Semiconductor Supplier

FREMONT, CA / ACCESSWIRE / January 7, 2025 / Aehr Test Systems (AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced it has received an initial production order ...
Semiconductor Engineering

Wafer Test Challenges For Chiplets

In a heterogeneous integrated system, the impact of composite yield fallout due to a single chiplet is creating new performance imperatives for wafer test in terms of test complexity and coverage.