Transforming data into deviations from the mean via standard deviations provides an objective yardstick to search for outliers. Analyzing data through the lens of Z-scores takes away quite a lot of ...

Comparing die test results with other die on a wafer helps identify outliers, but combining that data with the exact location of an outlier offers a much deeper understanding of what can go wrong and ...

After previously detailing how to examine data files and how to identify and deal with missing data, Dr. James McCaffrey of Microsoft Research now uses a full code sample and step-by-step directions ...